Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films  as determined by in situ time-resolved x-ray diffraction

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Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction
(Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction)

Seiji Nakashima, Osami Sakata, Hiroshi Funakubo, Takao Shimizu, Daichi Ichinose, Kota Takayama, Yasuhiko Imai, Hironori Fujisawa, Masaru Shimizu.

作成時刻: 2017-09-04 22:03:52 +0900更新時刻: 2024-03-30 01:30:21 +0900