HOME > 論文 > 書誌詳細In situ high temperature creep deformation of micro-structure with metal film wire on flexible membrane using geometric phase analysisQinghua Wang, Satoshi Kishimoto, Huimin Xie, Zhanwei Liu, Xinhao Lou. Microelectronics Reliability 53 [4] 652-657. 2013.https://doi.org/10.1016/j.microrel.2012.10.016 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:48:38 +0900更新時刻: 2024-04-02 04:01:39 +0900
