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In situ high temperature creep deformation of micro-structure with metal film wire on flexible membrane using geometric phase analysis

Qinghua Wang, Satoshi Kishimoto, Huimin Xie, Zhanwei Liu, Xinhao Lou.
Microelectronics Reliability 53 [4] 652-657. 2013.
https://doi.org/10.1016/j.microrel.2012.10.016

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