HOME > 論文 > 書誌詳細A Powerful Tool to Measure Residual Stress in Thermal Barrier Coatings: With the Photoluminescence Piezo-Spectroscopy Method, Spallation Life Can Be Analytically PredictedRudder T. Wu, Liberty T. Wu. IEEE Nanotechnology Magazine 11 [4] 20-23. 2017.https://doi.org/10.1109/mnano.2017.2747058 NIMS著者ウー ラダーMaterials Data Repository (MDR)上の本文・データセット作成時刻 :2018-01-18 20:43:50 +0900 更新時刻 :2018-12-27 11:46:48 +0900