HOME > Article > Detail透過型電子顕微鏡の組成分析への超伝導遷移端センサの応用原 徹, 田中啓一, 前畑京介, 満田和久. OYO BUTURI 81 [2] 139-142. 2012.https://doi.org/10.11470/oubutsu.81.2_139 NIMS author(s)HARA, ToruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:29:05 +0900 Updated at: 2026-11-09 08:37:53 +0900
