HOME > Article > DetailAtomic-scale characterization of metal micro-electrodes grown on clean semiconductor surfaces(半導体清浄表面上に成長した金属微細電極の原子スケール観察)Takashi Uchihashi, Urs Ramsperger. Thin Solid Films 438-439 61-64. 2003.https://doi.org/10.1016/s0040-6090(03)00759-4 NIMS author(s)UCHIHASHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:55:52 +0900 Updated at: 2026-11-04 05:59:21 +0900