Modern applications of a new 300kV field emission transmission electron microscope to the study of advanced materials | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Modern applications of a new 300kV field emission transmission electron microscope to the study of advanced materials

BANDO, Yoshio, KURASHIMA, Keiji, NAKANO, Satoshi.

Journal of the European Ceramics Society 379-384. 1996.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-05 10:46:11 +0900 Updated at: 2022-09-05 10:46:11 +0900

▲ Go to the top of this page