HOME > 論文 > 書誌詳細SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin filmsHANEDA, Hajime, OHGAKI Takeshi, SAKAGUCHI, Isao, RYOKEN, Haruki, OHASHI, Naoki, YASUMORI Atsuo. APPLIED SURFACE SCIENCE 7265-7268. 2006.NIMS著者羽田 肇坂口 勲大橋 直樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:15:00 +0900更新時刻: 2022-10-21 22:15:00 +0900
