HOME > Article > DetailPhase transition of the Si(111)-4x1-In surface reconstruction investigated by electron transport measurements(電気伝導測定によって調べたSi(111)-4X1-In表面超構造の相転移)Takashi Uchihashi, Urs Ramsperger. Surface Science 532-535 685-689. 2003.https://doi.org/10.1016/s0039-6028(03)00201-2 NIMS author(s)UCHIHASHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:49:57 +0900 Updated at: 2025-06-14 04:23:07 +0900