HOME > 論文 > 書誌詳細Quick atomic-scale structure imaging by synchrotron X-rays: A new tool for probing realistic inhomogeneous systemsSAKURAI, Kenji, 水沢まり. NANOTECHNOLOGY . 2004.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:01:55 +0900 更新時刻: 2022-10-21 22:01:55 +0900
