Crystal structure of La4Si2O7N2 Analyzed by the Rietveld Method Using the Time-of-Flight Neutron Powder Diffraction Data | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Crystal structure of La4Si2O7N2 Analyzed by the Rietveld Method Using the Time-of-Flight Neutron Powder Diffraction Data
(中性子線回折結果のリートベルト解析によるLa4Si2O7N2の結晶構造)

Junichi Takahashi, Hisanori Yamane, Naoto Hirosaki, Yoshinobu Yamamoto, Takayuki Suehiro, Takashi Kamiyama, Masahiko Shimada.

Chemistry of Materials 15 [5] 1099-1104. 2003.

https://doi.org/10.1021/cm020930c

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作成時刻: 2016-05-24 11:56:01 +0900 更新時刻: 2026-09-30 04:17:07 +0900

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