HOME > 論文 > 書誌詳細Universality of bias- and temperature-induced dephasing in ballistic electronic interfereometersY. Yamauchi, M. Hashisaka, S. Nakamura, K. Chida, S. Kasai, T. Ono, R. Leturcq, K. Ensslin, D. C. Driscoll, A. C. Gossard, K. Kobayashi. Physical Review B 79 [16] 161306. 2009.https://doi.org/10.1103/physrevb.79.161306 NIMS著者葛西 伸哉Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:57:08 +0900更新時刻: 2024-03-30 02:27:34 +0900