HOME > Article > DetailUniversality of bias- and temperature-induced dephasing in ballistic electronic interfereometersY. Yamauchi, M. Hashisaka, S. Nakamura, K. Chida, S. Kasai, T. Ono, R. Leturcq, K. Ensslin, D. C. Driscoll, A. C. Gossard, K. Kobayashi. Physical Review B 79 [16] 161306. 2009.https://doi.org/10.1103/physrevb.79.161306 NIMS author(s)KASAI, ShinyaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:57:08 +0900Updated at: 2024-04-30 06:13:45 +0900
