Size dependence of structural parameters in fcc and hcp Ru nanoparticles, revealed by Rietveld refinement analysis of high-energy X-ray diffraction data | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Size dependence of structural parameters in fcc and hcp Ru nanoparticles, revealed by Rietveld refinement analysis of high-energy X-ray diffraction data
(Size dependence of structural parameters in fcc and hcp Ru nanoparticles, revealed by Rietveld refinement analysis of high-energ X-ray diffraction data)

Chulho Song, Osami Sakata, Loku Singgappulige Rosantha Kumara, Shinji Kohara, Anli Yang, Kohei Kusada, Hirokazu Kobayashi, Hiroshi Kitagawa.

Scientific Reports 6 [1] 31400. 2016.

https://doi.org/10.1038/srep31400

Open Access Springer Nature (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-10-26 15:25:24 +0900 更新時刻: 2026-09-28 04:32:09 +0900

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