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NIMS Award Symposium 2026

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Electron induced nano-deposition of tungsten using field emission scanning and transmission electron microscopes
(電界放射型の走査および透過電子顕微鏡を用いたタングステンの電子線誘起ナノデポジション)

M. Shimojo, K. Mitsuishi, A. Tameike, K. Furuya.

NIMS author(s)


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    Created at: 2016-05-24 12:02:40 +0900 Updated at: 2026-09-30 04:15:49 +0900

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