HOME > 論文 > 書誌詳細Annealing-temperature-dependent voltage-sign reversal in all-oxide spin Seebeck devices using RuO2Akihiro Kirihara, Masahiko Ishida, Ryota Yuge, Kazuki Ihara, Yuma Iwasaki, Ryohto Sawada, Hiroko Someya, Ryo Iguchi, Ken-ichi Uchida, Eiji Saitoh, Shinichi Yorozu. Journal of Physics D: Applied Physics 51 [15] 154002. 2018.https://doi.org/10.1088/1361-6463/aab2cd NIMS著者岩﨑 悠真Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-04-02 21:06:37 +0900更新時刻: 2024-04-01 21:44:10 +0900
