HOME > 論文 > 書誌詳細Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopeDo Kyung Lim, Osamu Kubo, Yoshitaka Shingaya, Tomonobu Nakayama, Young Heon Kim, Jeong Yong Lee, Masakazu Aono, Hangil Lee, Dohyun Lee, Sehun Kim. Applied Physics Letters 92 [20] 203114. 2008.https://doi.org/10.1063/1.2935329 NIMS著者新ヶ谷 義隆中山 知信青野 正和Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:28:13 +0900更新時刻: 2024-04-01 20:59:24 +0900
