HOME > Article > DetailLow resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopeDo Kyung Lim, Osamu Kubo, Yoshitaka Shingaya, Tomonobu Nakayama, Young Heon Kim, Jeong Yong Lee, Masakazu Aono, Hangil Lee, Dohyun Lee, Sehun Kim. Applied Physics Letters 92 [20] 203114. 2008.https://doi.org/10.1063/1.2935329 NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:28:13 +0900 Updated at: 2026-10-01 05:42:43 +0900
