TEM Study of Local Conduction Mechanisms in Model Specimens of Ag-Based Conductive Adhesive | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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TEM Study of Local Conduction Mechanisms in Model Specimens of Ag-Based Conductive Adhesive
(導電性Agペーストのモデル試料における局所導電性メカニズムのTEM解析)

Keita Kurosu, Naoyuki Kawamoto, Yasukazu Murakami, Daisuke Shindo.

IEEE Transactions on Components, Packaging and Manufacturing Technology 2 [2] 294-299. 2012.

https://doi.org/10.1109/tcpmt.2011.2176734

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作成時刻: 2016-05-24 16:39:14 +0900 更新時刻: 2025-05-20 05:10:15 +0900

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