HOME > 論文 > 書誌詳細Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfacesHiroshi Shinotsuka, Kenji Nagata, Hideki Yoshikawa, Shuichi Ogawa, Akitaka Yoshigoe. Applied Surface Science 685 162001. 2025.https://doi.org/10.1016/j.apsusc.2024.162001 NIMS著者篠塚 寛志永田 賢二吉川 英樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2024-12-26 03:17:02 +0900更新時刻: 2024-12-27 03:17:15 +0900
