HOME > 論文 > 書誌詳細Crystallography-Derived Young’s Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron MicroscopyKonstantin L. Firestein, Dmitry G. Kvashnin, Joseph F.S. Fernando, Chao Zhang, Dumindu P. Siriwardena, Pavel B. Sorokin, Dmitri V. Golberg. Nano Letters 19 [3] 2084-2091. 2019.https://doi.org/10.1021/acs.nanolett.9b00263 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-04-17 03:13:17 +0900 更新時刻: 2025-07-15 05:43:28 +0900
