Crystallography-Derived Young’s Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy

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Konstantin L. Firestein, Dmitry G. Kvashnin, Joseph F.S. Fernando, Chao Zhang, Dumindu P. Siriwardena, Pavel B. Sorokin, Dmitri V. Golberg.

Nano Letters 19 [3] 2084-2091. 2019.

作成時刻: 2019-04-17 03:13:17 +0900更新時刻: 2024-12-08 05:41:44 +0900