Crystallography-Derived Young’s Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy

Konstantin L. Firestein, Dmitry G. Kvashnin, Joseph F.S. Fernando, Chao Zhang, Dumindu P. Siriwardena, Pavel B. Sorokin, Dmitri V. Golberg.

Nano Letters 19 [3] 2084-2091. 2019.

Created at: 2019-04-17 03:13:17 +0900Updated at: 2024-03-31 02:01:16 +0900