HOME > Article > DetailCrystallography-Derived Young’s Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron MicroscopyKonstantin L. Firestein, Dmitry G. Kvashnin, Joseph F.S. Fernando, Chao Zhang, Dumindu P. Siriwardena, Pavel B. Sorokin, Dmitri V. Golberg. Nano Letters 19 [3] 2084-2091. 2019.https://doi.org/10.1021/acs.nanolett.9b00263 NIMS author(s)GOLBERG, DmitriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-04-17 03:13:17 +0900Updated at: 2024-03-31 02:01:16 +0900