HOME > 論文 > 書誌詳細Epitaxial CeO2 thin films for a mechanism study of resistive random access memory (ReRAM)Michiko Yoshitake, Michal Vaclavu, Mykhailo Chundak, Vladimir Matolin, Toyohiro Chikyow. Journal of Solid State Electrochemistry 17 [12] 3137-3144. 2013.https://doi.org/10.1007/s10008-013-2200-6 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:07:23 +0900更新時刻: 2024-04-02 03:35:39 +0900
