HOME > Article > DetailEpitaxial CeO2 thin films for a mechanism study of resistive random access memory (ReRAM)Michiko Yoshitake, Michal Vaclavu, Mykhailo Chundak, Vladimir Matolin, Toyohiro Chikyow. Journal of Solid State Electrochemistry 17 [12] 3137-3144. 2013.https://doi.org/10.1007/s10008-013-2200-6 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:07:23 +0900 Updated at: 2026-10-08 05:26:58 +0900
