HOME > 論文 > 書誌詳細Imaging conducting holes in field-effect transistorsKeiki Fukumoto, Kosuke Yoshikawa, Konoha Shimizu, Elizaveta Pyatenko, Yoichi Yamada, Yutaka Wakayama, Ryoma Hayakawa. Applied Physics Reviews 13 [4] 041410. 2026.https://doi.org/10.1063/5.0335842 Open Access AIP Publishing (Publisher) Materials Data Repository (MDR) NIMS著者若山 裕早川 竜馬Materials Data Repository (MDR)上の本文・データセットMDRavailable Imaging conducting holes in field-effect transistors 作成時刻: 2026-11-06 03:06:32 +0900 更新時刻: 2026-11-07 03:05:51 +0900
