Determination of the number of atoms present in nano contact based on shot noise measurements with highly stable nano fabricated electrodes

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Determination of the number of atoms present in nano contact based on shot noise measurements with highly stable nano-fabricated electrodes
(Determination of the number of atoms present in nano contact based on shot noise measurements with highly stable nano fabricated electrodes)

Ryoji Takahashi, Satoshi Kaneko, Santiago Marqués-González, Shintaro Fujii, Tomoaki Nishino, Kazuhito Tsukagoshi, Manabu Kiguchi.

Nanotechnology 27 [29] 295203. 2016.

作成時刻: 2016-07-11 14:09:46 +0900更新時刻: 2024-04-01 20:52:45 +0900