In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope | SAMURAI, NIMS Researchers Directory Service

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In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope
(In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope.)

Chao Zhang, Zhi Xu, Wei Tian, Dai-Ming Tang, Xi Wang, Yoshio Bando, Naoki Fukata, Dmitri Golberg.

Nanotechnology 26 [15] 154001. 2015.

https://doi.org/10.1088/0957-4484/26/15/154001

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:47:50 +0900 Updated at: 2026-09-26 04:14:48 +0900

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