In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope
(In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope.)

Chao Zhang, Zhi Xu, Wei Tian, Dai-Ming Tang, Xi Wang, Yoshio Bando, Naoki Fukata, Dmitri Golberg.

Nanotechnology 26 [15] 154001. 2015.

https://doi.org/10.1088/0957-4484/26/15/154001

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作成時刻: 2016-05-24 17:47:50 +0900更新時刻: 2024-04-01 17:25:28 +0900

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