Microwave Properties and Critical Current Density of YBCO Thin Films Deposited on CeO2-Buffered Sapphire Substrates Using Sputtering Targets of Different Compositions | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Microwave Properties and Critical Current Density of YBCO Thin Films Deposited on CeO2-Buffered Sapphire Substrates Using Sputtering Targets of Different Compositions

Kyoko Kawagishi, Kazunori Komori, Masao Fukutomi, Kazumasa Togano.

Japanese Journal of Applied Physics 44 [7A] 4926-4929. 2005.

https://doi.org/10.1143/jjap.44.4926

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作成時刻: 2016-05-24 14:45:52 +0900 更新時刻: 2026-10-01 06:03:13 +0900

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