HOME > 論文 > 書誌詳細Combination of projection-based XRF, XAFS and XRD imagings for rapid spatial distribution analysis of a heterogeneous materialHiromi Eba, Hitoshi Ooyama, Kenji Sakurai. Journal of Analytical Atomic Spectrometry 31 [5] 1105-1111. 2016.https://doi.org/10.1039/c6ja00024j NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 18:08:58 +0900 更新時刻: 2026-11-09 07:57:04 +0900
