HOME > 論文 > 書誌詳細Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis methodH. Jin, H. Shinotsuka, H. Yoshikawa, H. Iwai, S. Tanuma, S. Tougaard. Journal of Applied Physics 107 [8] 083709. 2010.https://doi.org/10.1063/1.3346345 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:02:53 +0900更新時刻: 2024-03-31 18:03:35 +0900