Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy

Stefan G. Stanciu; Denis E. Tranca; Laura Pastorino; Stefania Boi; Young Min Song; Young Jin Yoo; Satoshi Ishii; Radu Hristu; Fang Yang; Gianlorenzo Bussetti; George A. Stanciu

doi:10.1021/acsanm.9b02019

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Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy

Stefan G. Stanciu, Denis E. Tranca, Laura Pastorino, Stefania Boi, Young Min Song, Young Jin Yoo, Satoshi Ishii, Radu Hristu, Fang Yang, Gianlorenzo Bussetti, George A. Stanciu.

ACS Applied Nano Materials 3 [2] 1250-1262. 2020.

https://doi.org/10.1021/acsanm.9b02019

NIMS著者

石井智

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2020-04-22 03:00:18 +0900更新時刻: 2024-04-02 01:23:36 +0900