Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy

Stefan G. Stanciu; Denis E. Tranca; Laura Pastorino; Stefania Boi; Young Min Song; Young Jin Yoo; Satoshi Ishii; Radu Hristu; Fang Yang; Gianlorenzo Bussetti; George A. Stanciu; Stefan G. Stanciu; Denis E. Tranca; Laura Pastorino; Stefania Boi; Young Min Song; Young Jin Yoo; Satoshi Ishii; Radu Hristu; Fang Yang; Gianlorenzo Bussetti; George A. Stanciu

doi:10.1021/acsanm.9b02019

Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy

Stefan G. Stanciu, Denis E. Tranca, Laura Pastorino, Stefania Boi, Young Min Song, Young Jin Yoo, Satoshi Ishii, Radu Hristu, Fang Yang, Gianlorenzo Bussetti, George A. Stanciu.

ACS Applied Nano Materials 3 [2] 1250-1262. 2020.

https://doi.org/10.1021/acsanm.9b02019

NIMS author(s)

ISHII, Satoshi

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-04-22 03:00:18 +0900 Updated at: 2026-10-07 04:42:11 +0900