Local electrical properties of n-AlInAs/i-GaInAs electron channel structures characterized by theprobe-electron-beam-induced current technique
(プローブEBIC 法によるn-AlInAs/i-GaInAs電子チャネル構造の局所電気特性評価)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 17:14:12 +0900Updated at: 2024-04-02 04:56:58 +0900