Local electrical properties of n-AlInAs/i-GaInAs electron channel structures characterized by theprobe-electron-beam-induced current technique
(プローブEBIC 法によるn-AlInAs/i-GaInAs電子チャネル構造の局所電気特性評価)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 17:14:12 +0900 Updated at: 2026-10-08 06:39:31 +0900