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Microstructure and shape memory behaviour of annealed Ti51.5Ni(48.5-X)CuX (X=6.5-20.9) thin films
(Ti51.5Ni(48.5-X)CuX (X=6.5-20.9) 薄膜の微細組織と形状記憶挙動)

A. Ishida, M. Sato.
Philosophical Magazine 87 [35] 5523-5538. 2007.

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