Microstructure and shape memory behaviour of annealed Ti51.5Ni(48.5-X)CuX (X=6.5-20.9) thin films
(Ti51.5Ni(48.5-X)CuX (X=6.5-20.9) 薄膜の微細組織と形状記憶挙動)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 15:14:35 +0900 Updated at: 2026-11-02 04:18:26 +0900
