HOME > 論文 > 書誌詳細In Situ High-Resolution Transmission Electron Microscopy of Elastic Deformation and Fracture of Nanometer-Sized Fullerene C60 WhiskersRyoei Kato, Koji Asaka, Kun'ichi Miyazawa, Tokushi Kizuka. Japanese Journal of Applied Physics 45 [10A] 8024-8026. 2006.https://doi.org/10.1143/jjap.45.8024 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:02:55 +0900 更新時刻: 2026-11-04 06:29:14 +0900
