Luminance histogram analysis for RHEED images using peak fitting approach with machine learning technique | SAMURAI, NIMS Researchers Directory Service

Scheduled downtime (October 31st and November 1st, 2026) (2026-10-29)

HOME > Article > Detail

Luminance histogram analysis for RHEED images using peak fitting approach with machine learning technique

Asako Yoshinari, Yasunobu Ando, Tarojiro Matsumura, Masato Kotsugi, Shuji Hasegawa, Rei Hobara, Naoka Nagamura.

Science and Technology of Advanced Materials: Methods 6 [1] 2666924. 2026.

https://doi.org/10.1080/27660400.2026.2666924

Open Access Informa UK Limited (Publisher)

NIMS author(s)

NAGAMURA, Naoka

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2026-10-31 03:06:40 +0900 Updated at: 2026-11-01 03:41:04 +0900

▲ Go to the top of this page