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Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
(Bright-fieldscanningconfocalelectronmicroscopyusingadouble aberration-correctedtransmissionelectronmicroscope)

Peng Wang, Gavin Behan, Angus I. Kirkland, Peter D. Nellist, Eireann C. Cosgriff, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo.
Ultramicroscopy 111 [7] 877-886. 2011.
https://doi.org/10.1016/j.ultramic.2010.10.012

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      作成時刻: 2016-05-24 16:33:28 +0900更新時刻: 2024-04-02 04:20:50 +0900

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