Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang; Gavin Behan; Angus I. Kirkland; Peter D. Nellist; Eireann C. Cosgriff; Adrian J. D’Alfonso; Andrew J. Morgan; Leslie J. Allen; Ayako Hashimoto; Masaki Takeguchi; Kazutaka Mitsuishi; Masayuki Shimojo; Peng Wang; Gavin Behan; Angus I. Kirkland; Peter D. Nellist; Eireann C. Cosgriff; Adrian J. D’Alfonso; Andrew J. Morgan; Leslie J. Allen; Ayako Hashimoto; Masaki Takeguchi; Kazutaka Mitsuishi; Masayuki Shimojo

doi:10.1016/j.ultramic.2010.10.012

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
(Bright-fieldscanningconfocalelectronmicroscopyusingadouble aberration-correctedtransmissionelectronmicroscope)

Peng Wang, Gavin Behan, Angus I. Kirkland, Peter D. Nellist, Eireann C. Cosgriff, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo.

Ultramicroscopy 111 [7] 877-886. 2011.

https://doi.org/10.1016/j.ultramic.2010.10.012

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:33:28 +0900 Updated at: 2026-10-08 06:07:16 +0900

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope(Bright-fieldscanningconfocalelectronmicroscopyusingadouble aberration-correctedtransmissionelectronmicroscope)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
(Bright-fieldscanningconfocalelectronmicroscopyusingadouble aberration-correctedtransmissionelectronmicroscope)