HOME > 論文 > 書誌詳細Plasma Etching of TEM Samples for Observing Grain Boundary in Silicon Nitride末松久幸, BANDO, Yoshio, 三友護. Journal of Electron Microscopy . 1994.NIMS著者板東 義雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:43:32 +0900 更新時刻: 2022-09-05 10:43:32 +0900
