HOME > Article > DetailExtraction of hidden information of ToF-SIMS data using different multivariate analysesYuta Yokoyama, Tomoko Kawashima, Mayumi Ohkawa, Hideo Iwai, Satoka Aoyagi. Surface and Interface Analysis 47 [4] 439-446. 2015.https://doi.org/10.1002/sia.5731 NIMS author(s)IWAI, HideoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:47:21 +0900Updated at: 2024-04-01 17:56:35 +0900