HOME > Article > DetailBulk electronic properties of FeSi1-xGex investigated by high-resolution x-ray spectroscopiesH. Yamaoka, N. Tsujii, H. Oohashi, D. Nomoto, I. Jarrige, K. Takahiro, K. Ozaki, K. Kawatsura, Y. Takahashi. Physical Review B 77 [11] 115201. 2008.https://doi.org/10.1103/physrevb.77.115201 NIMS author(s)TSUJII, NaohitoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:27:36 +0900Updated at: 2024-04-02 00:17:31 +0900
