Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping: estimation from X-ray Debye–Waller factors | SAMURAI, NIMS Researchers Directory Service

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Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping: estimation from X-ray Debye–Waller factors
(Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping: estimation from X-ray Debye–Waller factors)

Anli Yang, Osami Sakata, Ryosuke Yamauchi, L. S. R. Kumara, Chulho Song, Yoshio Katsuya, Akifumi Matsuda, Mamoru Yoshimoto.

Journal of Applied Crystallography 48 [6] 1896-1900. 2015.

https://doi.org/10.1107/s1600576715020002

Open Access International Union of Crystallography (IUCr) (Publisher)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:47:33 +0900Updated at: 2024-04-30 05:09:24 +0900

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