HOME > 論文 > 書誌詳細In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscopeD. Golberg, M. Mitome, K. Kurashima, C. Y. Zhi, C. C. Tang, Y. Bando, O. Lourie. Applied Physics Letters 88 [12] 123101. 2006.https://doi.org/10.1063/1.2186987 NIMS著者ゴルバーグ デミトリ三留 正則倉嶋 敬次板東 義雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:00:15 +0900更新時刻: 2024-12-07 04:31:24 +0900
