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In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope

D. Golberg, M. Mitome, K. Kurashima, C. Y. Zhi, C. C. Tang, Y. Bando, O. Lourie.
Applied Physics Letters 88 [12] 123101. 2006.
https://doi.org/10.1063/1.2186987

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