HOME > 論文 > 書誌詳細Angled long tip to tuning fork probes for atomic force microscopy in various environmentsSeiji Higuchi, Hiromi Kuramochi, Osamu Kubo, Shintaro Masuda, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama. Review of Scientific Instruments 82 [4] 043701. 2011.https://doi.org/10.1063/1.3569765 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:21:13 +0900 更新時刻: 2025-05-13 06:42:25 +0900
