HOME > Article > DetailAngled long tip to tuning fork probes for atomic force microscopy in various environmentsSeiji Higuchi, Hiromi Kuramochi, Osamu Kubo, Shintaro Masuda, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama. Review of Scientific Instruments 82 [4] 043701. 2011.https://doi.org/10.1063/1.3569765 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:21:13 +0900Updated at: 2025-03-11 06:32:39 +0900
