HOME > 論文 > 書誌詳細Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopyYi-Tao Cui, Sven Tougaard, Hiroshi Oji, Jin-Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa. Journal of Applied Physics 121 [22] 225307. 2017.https://doi.org/10.1063/1.4985176 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-06-17 21:28:57 +0900 更新時刻: 2026-10-29 05:24:51 +0900
