HOME > 論文 > 書誌詳細Secondary electron imaging of embedded defects in carbon nanofiber via interconnectsMakoto Suzuki, Yusuke Ominami, Takashi Sekiguchi, Cary Y. Yang. Applied Physics Letters 93 [26] 263110. 2008.https://doi.org/10.1063/1.3063053 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:49:31 +0900更新時刻: 2024-03-31 17:45:50 +0900
