HOME > Article > DetailSecondary electron imaging of embedded defects in carbon nanofiber via interconnectsMakoto Suzuki, Yusuke Ominami, Takashi Sekiguchi, Cary Y. Yang. Applied Physics Letters 93 [26] 263110. 2008.https://doi.org/10.1063/1.3063053 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at :2016-05-24 15:49:31 +0900 Updated at :2022-09-05 12:13:47 +0900