HOME > 論文 > 書誌詳細Auger Electron Spectroscopy: A Rational Method for Determining Thickness of Graphene FilmsMingsheng Xu, Daisuke Fujita, Jianhua Gao, Nobutaka Hanagata. ACS Nano 4 [5] 2937-2945. 2010.https://doi.org/10.1021/nn100276w NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:06:38 +0900更新時刻: 2024-04-02 06:02:45 +0900
